Introduction of the high-end hybrid optical appearance inspection device 'YSi-V'.
Five different methods can be selected for optimal inspection! An optical appearance inspection device has been introduced.
We have introduced the high-end hybrid optical appearance inspection device 'YSi-V', which integrates 2D inspection, 3D inspection, and 4-directional angled image inspection into a single unit. You can select from five different methods for optimal inspection. By introducing this device, we have transitioned from visual inspection to machine inspection, enabling quality improvement for small chips such as 0402 and 0603, as well as inspection of multilayer PCBs. 【Features】 ■ High-speed, high-resolution 2D inspection ■ Height and inclined surface 3D inspection (optional) ■ 4-direction angle camera (optional) ■ Software that supports real-time, high-efficiency inspection *For more details, please refer to the external link or feel free to contact us.
- Company：土佐電子
- Price：Other
